SEM characterization and XPS analysis of copper layers on carbon fiber

doi:10.13251/j.issn.0254-6051.2017.04.036

HTM

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SEM characterization and XPS analysis of copper layers on carbon fiber

1.State Key Laboratory of Advanced Processing and Recycling of Nonferrous Metals; 2.College of Materials Science and Engineering, Lanzhou University of Technology; 3.Hao Shi Carbon Fiber Co.Ltd

Online:2017-04-25 Published:2017-05-08

Abstract

CLC Number:

TG174

Ji Genshun1,2，Zhang Yuming2，Xue Xiangjun3，Liu Jinxin2. SEM characterization and XPS analysis of copper layers on carbon fiber[J]. HTM, doi: 10.13251/j.issn.0254-6051.2017.04.036.

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SEM characterization and XPS analysis of copper layers on carbon fiber

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